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Date : 1989-11-01

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Secondary Ion Mass Spectrometry—a Practical Handbook for ~ Secondary Ion Mass Spectrometry—a Practical Handbook for Depth Profiling and Bulk Impurity Analysis Wiley New York 1989 J B Clegg Philips Research Labs Redhill Surrey Search for more papers by this author J B Clegg Philips Research Labs Redhill Surrey

Secondary ion mass spectrometry a practical handbook for ~ Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis Responsibility Wilson Stevie Magee Secondary ion mass spectrometry Bibliographic information Publication date 1989 Note A WileyInterscience publication

Secondary ion mass spectrometry a practical handbook for ~ Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis Robert G Wilson F A Stevie C W Magee Wiley Nov 2 1989 Science 384 pages

Secondary ion mass spectrometry a practical handbook for ~ Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis Magee C Stevie F Wilson R A WileyInterscience publication Recent Publications August 01 2019 Protecting photonic quantum states using topology BlancoRedondo A

Secondary ion mass spectrometry a practical handbook for ~ Get this from a library Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis Robert G Wilson F A Stevie C W Magee

Secondary ion mass spectrometry SIMS VI Book ~ Secondary ion mass spectrometry SIMS has become a powerful technique for the labelfree analysis of organics from cells to electronic devices The development of cluster ion sources has revolutionized the field increasing the sensitivity for organics by two or three orders of magnitude and for large clusters such as Csub 60 and argon clusters allowing depth profiling of organics

TimeofFlight Secondary Ion Mass Spectrometry ~ Depth profiling by TOFSIMS allows monitoring of all species of interest simultaneously and with high mass resolution TimeofFlight Secondary Ion Mass Spectrometry TOFSIMS is an analytical technique that uses a primary ion beam to probe the surface of a solid material The secondary ions which desorb from the sample surface are analyzed and their mass is determined with high accuracy

Secondary Ion Mass Spectroscopy SIMS PPT ~ Mass Spectroscopy Mass spectrometry MS is an analytical technique that measures mass to Charge ratio of charged particles Secondary ion mass spectrometry Secondary ion mass spectrometry SIMS is based on the observation of charged particles Secondary Ions are ejected from a sample surface when bombarded by a primary beam of heavy particles

Secondary Ion Mass Spectrometry A Practical Handbook for ~ Secondary Ion Mass Spectrometry A Practical Handbook for Depth Profiling and Bulk Impurity Analysis R G Wilson F A Stevie C W Magee Libros